Experimental Testing of Power Semiconductor Devices for Thermal Stability under Static and Dynamic Current Overloads
The justification of a system for diagnosing the technical condition of power semiconductor devices, based on the principles of nondestructive testing has been reviewed. An assessment of the current state of protection means for semiconductor products is given. The theoretical foundations forming th...
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| Язык: | English |
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Pleiades Publishing
2025
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| Online-ссылка: | https://dspace.ncfu.ru/handle/123456789/31858 |
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ir-123456789-318582025-08-14T14:15:40Z Experimental Testing of Power Semiconductor Devices for Thermal Stability under Static and Dynamic Current Overloads Khorol’skii, V. Y. Хорольский, В. Я. Isupova, A. M. Исупова, А. М. Power semiconductor devices Nondestructive examination Static and dynamic current overloads Electronic equipment testing Thermal stability Current overloads The justification of a system for diagnosing the technical condition of power semiconductor devices, based on the principles of nondestructive testing has been reviewed. An assessment of the current state of protection means for semiconductor products is given. The theoretical foundations forming the basis for the development of such systems are presented, along with the results of experimental studies on a prototype device. 2025-08-14T14:14:40Z 2025-08-14T14:14:40Z 2025 Статья Khorolsky, V. Y, Isupova, A. M., Yundin, K. M., Sharipov, I. K. Experimental Testing of Power Semiconductor Devices for Thermal Stability under Static and Dynamic Current Overloads // Russian Electrical Engineering. - 2025. - 96 (5). - pp. 359 - 363. - DOI: 10.3103/S1068371225700464 https://dspace.ncfu.ru/handle/123456789/31858 en Russian Electrical Engineering application/pdf Pleiades Publishing |
| institution |
СКФУ |
| collection |
Репозиторий |
| language |
English |
| topic |
Power semiconductor devices Nondestructive examination Static and dynamic current overloads Electronic equipment testing Thermal stability Current overloads |
| spellingShingle |
Power semiconductor devices Nondestructive examination Static and dynamic current overloads Electronic equipment testing Thermal stability Current overloads Khorol’skii, V. Y. Хорольский, В. Я. Isupova, A. M. Исупова, А. М. Experimental Testing of Power Semiconductor Devices for Thermal Stability under Static and Dynamic Current Overloads |
| description |
The justification of a system for diagnosing the technical condition of power semiconductor devices, based on the principles of nondestructive testing has been reviewed. An assessment of the current state of protection means for semiconductor products is given. The theoretical foundations forming the basis for the development of such systems are presented, along with the results of experimental studies on a prototype device. |
| format |
Статья |
| author |
Khorol’skii, V. Y. Хорольский, В. Я. Isupova, A. M. Исупова, А. М. |
| author_facet |
Khorol’skii, V. Y. Хорольский, В. Я. Isupova, A. M. Исупова, А. М. |
| author_sort |
Khorol’skii, V. Y. |
| title |
Experimental Testing of Power Semiconductor Devices for Thermal Stability under Static and Dynamic Current Overloads |
| title_short |
Experimental Testing of Power Semiconductor Devices for Thermal Stability under Static and Dynamic Current Overloads |
| title_full |
Experimental Testing of Power Semiconductor Devices for Thermal Stability under Static and Dynamic Current Overloads |
| title_fullStr |
Experimental Testing of Power Semiconductor Devices for Thermal Stability under Static and Dynamic Current Overloads |
| title_full_unstemmed |
Experimental Testing of Power Semiconductor Devices for Thermal Stability under Static and Dynamic Current Overloads |
| title_sort |
experimental testing of power semiconductor devices for thermal stability under static and dynamic current overloads |
| publisher |
Pleiades Publishing |
| publishDate |
2025 |
| url |
https://dspace.ncfu.ru/handle/123456789/31858 |
| work_keys_str_mv |
AT khorolskiivy experimentaltestingofpowersemiconductordevicesforthermalstabilityunderstaticanddynamiccurrentoverloads AT horolʹskijvâ experimentaltestingofpowersemiconductordevicesforthermalstabilityunderstaticanddynamiccurrentoverloads AT isupovaam experimentaltestingofpowersemiconductordevicesforthermalstabilityunderstaticanddynamiccurrentoverloads AT isupovaam experimentaltestingofpowersemiconductordevicesforthermalstabilityunderstaticanddynamiccurrentoverloads |
| _version_ |
1842245888538312704 |