Experimental Testing of Power Semiconductor Devices for Thermal Stability under Static and Dynamic Current Overloads
The justification of a system for diagnosing the technical condition of power semiconductor devices, based on the principles of nondestructive testing has been reviewed. An assessment of the current state of protection means for semiconductor products is given. The theoretical foundations forming th...
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| Главные авторы: | , , , |
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| Формат: | Статья |
| Язык: | English |
| Опубликовано: |
Pleiades Publishing
2025
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| Темы: | |
| Online-ссылка: | https://dspace.ncfu.ru/handle/123456789/31858 |
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