Léim chuig an ábhar

Resonant-frequency properties of low-dimensional junction of semiconductor-metal-semiconductor and calculation methodology

The article describes frequency characteristics of semiconductor-metal-semiconductor Si-Ag-Si structures (ohmic contacts) having metal nanolayers as well as features of resonance phenomenon and sandwich structure energy interaction. Mathematical simulation of mentioned above processes is provided. T...

Cur síos iomlán

Sábháilte in:
Sonraí bibleagrafaíochta
Príomhchruthaitheoirí: Valyukhov, D. P., Валюхов, Д. П., Baklanov, I. S., Бакланов, И. С., Shtab, E. V., Штаб, Э. В., Shtab, A. V., Штаб, А. В., Pigulev, R. V., Пигулев, Р. В., Iliasov, A. S., Ильясов, А. Ш.
Formáid: Статья
Teanga:English
Foilsithe / Cruthaithe: Institute of Physics Publishing 2020
Ábhair:
Rochtain ar líne:https://www.scopus.com/record/display.uri?eid=2-s2.0-85077954308&origin=resultslist&sort=plf-f&src=s&st1=Resonant-frequency+properties+of+low-dimensional+junction+of+semiconductor-metal-semiconductor+and+calculation+methodology&st2=&sid=06bfe297a5d6aa23ab9ecf239eeb9ff0&sot=b&sdt=b&sl=137&s=TITLE-ABS-KEY%28Resonant-frequency+properties+of+low-dimensional+junction+of+semiconductor-metal-semiconductor+and+calculation+methodology%29&relpos=0&citeCnt=0&searchTerm=
https://dspace.ncfu.ru/handle/20.500.12258/11217
Clibeanna: Cuir clib leis
Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!