Influence of argon pressure on the surface morphology of thin InGaAsP/Si films
The thin films of InGaAsP/Si were obtained by pulsed laser deposition at different argon pressures. The InGaAsP/Si films obtained at an argon pressure of 10 Pa have the highest roughness, and the smallest are films obtained in a vacuum. In PLD in argon, atoms are scattered on the substrate at differ...
Saved in:
Main Authors: | Devitsky, O. V., Девицкий, О. В. |
---|---|
Format: | Статья |
Language: | English |
Published: |
American Institute of Physics Inc.
2022
|
Subjects: | |
Online Access: | https://dspace.ncfu.ru/handle/20.500.12258/21198 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Influence of magnetron sputtering conditions on the structure and surface morphology of InxGa1–xAs thin films on a GaAs (100) substrate
by: Devitsky, O. V., et al.
Published: (2023) -
Effect of nitrogen pressure on the composition and structure of thin films GaAs1 - x - yNxBiy
by: Devitsky, O. V., et al.
Published: (2024) -
Peculiarities of pulsed laser deposition of thin InGaAsN films in an active background gas atmosphere
by: Devitsky, O. V., et al.
Published: (2023) -
STRUCTURE AND COMPOSITION OF THIN GaAs1-x-yNxBiy FILMS PRODUCED BY PULSED LASER DEPOSITION
by: Devitsky, O. V., et al.
Published: (2023) -
Study of the composition of GaAs1-yBiy films obtained by pulsed laser deposition
by: Devitsky, O. V., et al.
Published: (2022)