Investigation of GexSi1 –x/Si nanoheterostructures grown by ion-beam deposition
GexSi1 – x/Si nanoheterostructures are synthesized via ion-beam deposition. The crystal structure, surface morphology, and chemical composition are investigated using X-ray diffraction, Raman spectroscopy, scanning probe microscopy, and Auger electron spectroscopy methods. The germanium content is s...
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| Główni autorzy: | , |
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| Format: | Статья |
| Język: | English |
| Wydane: |
Pleiades Publishing
2019
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| Hasła przedmiotowe: | |
| Dostęp online: | https://www.scopus.com/record/display.uri?eid=2-s2.0-85067959397&origin=resultslist&sort=plf-f&src=s&st1=Investigation+of+GexSi1+--x%2fSi+Nanoheterostructures+Grown+by+Ion-Beam+Deposition&st2=&sid=6e4a3f0a57961460ec602538180ac367&sot=b&sdt=b&sl=95&s=TITLE-ABS-KEY%28Investigation+of+GexSi1+--x%2fSi+Nanoheterostructures+Grown+by+Ion-Beam+Deposition%29&relpos=0&citeCnt=0&searchTerm= https://dspace.ncfu.ru/handle/20.500.12258/5975 |
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https://www.scopus.com/record/display.uri?eid=2-s2.0-85067959397&origin=resultslist&sort=plf-f&src=s&st1=Investigation+of+GexSi1+--x%2fSi+Nanoheterostructures+Grown+by+Ion-Beam+Deposition&st2=&sid=6e4a3f0a57961460ec602538180ac367&sot=b&sdt=b&sl=95&s=TITLE-ABS-KEY%28Investigation+of+GexSi1+--x%2fSi+Nanoheterostructures+Grown+by+Ion-Beam+Deposition%29&relpos=0&citeCnt=0&searchTerm=https://dspace.ncfu.ru/handle/20.500.12258/5975