Исследование наноразмерных пленок AlN методом АСМ
Shranjeno v:
Glavni avtor: | Кузнецова, Е. А. |
---|---|
Format: | ВКР |
Jezik: | Russian |
Izdano: |
2018
|
Online dostop: | https://dspace.ncfu.ru:443/handle/20.500.12258/2328 |
Oznake: |
Označite
Brez oznak, prvi označite!
|
Podobne knjige/članki
-
Исследование наноразмерных пленок AlN методом АСМ
od: Кузнецова, Е. А.
Izdano: (2018) -
Ion-beam deposition of thin AlN films on Al2O3 substrate
od: Devitsky, O. V., и др.
Izdano: (2020) -
Growing oriented AlN films on sapphire substrates by plasma-enhanced atomic layer deposition
od: Tarala, V. A., и др.
Izdano: (2018) -
Growing oriented AlN films on sapphire substrates by plasma-enhanced atomic layer deposition
od: Tarala, V. A., и др.
Izdano: (2018) -
Schotky barrier height and calculation of voltage–current characteristics of Al/n-(SiC)1–x(AlN)x diodes And 4H–SiC heterojunctions
od: Altukhov, V. I., и др.
Izdano: (2020)