Modeling of the influence of defects on the electronic structure of silicon nanoclusters

Modeling of the influence of defects on the electronic structure of silicon nanoclusters

Abstract The total and partial electron densities of states of defect-free and imperfect silicon clusters have been calculated by a semiempirical method. The local centers produced in the band gap of silicon by doping have been shown to be determined predominantly by the intrinsic states of silicon

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書誌詳細
主要な著者:	Sokolenko, E. V., Соколенко, Е. В.
フォーマット:	Статья
言語:	English
出版事項:	Maik Nauka Publishing / Springer SBM 2018
主題:	Defects Electronic structure Energy gap Silicon
オンライン･アクセス:	https://www.scopus.com/record/display.uri?eid=2-s2.0-84938559290&origin=resultslist&sort=plf-f&src=s&nlo=1&nlr=20&nls=afprfnm-t&affilName=north+caucasus+federal+university&sid=dc7f8c6f40c1112203ece798567bdeb2&sot=afnl&sdt=cl&cluster=scopubyr%2c%222015%22%2ct&sl=53&s=%28AF-ID%28%22North+Caucasus+Federal+University%22+60070541%29%29&relpos=12&citeCnt=0&searchTerm= https://dspace.ncfu.ru/handle/20.500.12258/3693
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